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Oxford Instruments CMI165 Copper Thickness Gauge with Temperature Compensation

Oxford Instruments CMI165 Copper Thickness Gauge with Temperature Compensation

Price:
Was: $3,360.00
Now: $3,325.00
SKU:
091709
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Oxford Instruments CMI165 Copper Thickness Gauge with Temperature Compensation
Oxford Instruments CMI165 Copper Thickness Gauge with Temperature Compensation
Oxford Instruments CMI165 Copper Thickness Gauge with Temperature Compensation
 

Copper Thickness Gauge with Temperature Compensation - Oxford Instruments CMI165

The CMI165 provides unique temperature compensated Copper Thickness Measurements in an ergonomic compact hand-held device. Measurements on Copper are affected by the temperature of the measured sample. The CMI 165 accounts for temperature in the measurement of thickness ensuring accurate in-process inspection results regardless of Copper temperature. This versatile, portable gauge equipped with protective case, has a rugged and durable design that allows it to be taken into the harshest environments.

 

 

 

 APPLICATIONS:

 

  • Measure hot or cold Cu on PCBs

  • Reduce waste by eliminating the need for coupons

  • Measure foil or laminated Cu thickness in μm, mils or oz

  • Sort Cu by weight at incoming drilling, shearing or plating

  • Quantify Cu thickness after etching or planarizing

  • Verify Cu plating thickness on PCB surfaces

 

 

 FEATURES:

 

  • SRP-T1 Replaceable Probe Tip - no recalibration necessary

  • Spare SRP-T1 replacement tip ensures no factory downtime

  • Illuminated probe tip for easy positioning on copper traces

  • User Interface available in both English and Simplified Chinese

 

 

 SPECIFICATIONS:

 

  • Copper thickness is measured using 4-point probe electrical resistance method

    and conforms to standard EN 14571

  • Thickness measurement ranges:
    Copper Electroless: (0.25-12.7) μm, (0.01-0.5) mils
    Copper Electrodeposited: (2.0-254) μm, (0.1-10) mils

  • High repeatability and reliability: σ= 0.08 μm at 20 μm (0.003 mils at 0.79 mils)

  • Statistical analysis includes data recording, average, standard deviation and high-low reporting

  • Measurement units in μm, mils or oz

  • User interface in English or Simplified Chinese

  • Measure etched traces as thin as 204 μm (8mils) without line width standards

  • Store 9,690 measurements (with optional date and time stamp)

  • USB 2.0 high-speed data transfer interfaced with Microsoft Excel

  • Factory calibrated and certified by Oxford Instruments

  • Customizable for other applications

  • Static or continuous mode measurement

  • Powered by regular AA batteries

 

 

 

 SUPPLIED WITH:

 

  • OICM CMI165 Copper Thickness Gauge

  • Spare SRP-T1 Replacement Probe Tip

  • OICM Protective carrying case with a belt clip

  • 2 AAA alkaline batteries

  • OICM NIST Traceable Test Calibration Certificate

  • Quick Start Guide / Instruction manual

 

 

 DOWNLOADS:

 

 

 

 

 

 SEARCH KEYWORDS:

 

 

Copper Thickness Gauge | Copper Thickness Meter | Copper Thickness Measurement | Copper Measurement | OICM CMI 165 | Oxford Instruments CMI165

 

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